RECOMBINATION-ENHANCED DEFECT REACTIONS STRONG NEW EVIDENCE FOR AN OLD CONCEPT IN SEMICONDUCTORS

被引:75
作者
DEAN, PJ [1 ]
CHOYKE, WJ [1 ]
机构
[1] RSRE,GREAT MALVERN,WORCESTERSHIRE,ENGLAND
关键词
D O I
10.1080/00018737700101343
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
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页码:1 / 30
页数:30
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