ADMITTANCE PROBE MEASUREMENTS IN DOUBLE INVERSE PINCH DEVICE

被引：9

作者：

BAUM, PJ ^{[1
]}

POLLACK, J ^{[1
]}

机构：

[1] UNIV CALIF,INST GEOPHYS & PLANETARY PHYS,RIVERSIDE,CA 92502

来源：

JOURNAL OF APPLIED PHYSICS | 1973年 / 44卷 / 01期

关键词：

D O I：

10.1063/1.1661853

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：163 / 167

页数：5

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