AN X-RAY SPECTROMETER FOR INELASTIC-SCATTERING EXPERIMENTS .1. CURVED-CRYSTAL X-RAY OPTICS

被引：33

作者：

SUORTTI, P ^{[1
]}

PATTISON, P ^{[1
]}

WEYRICH, W ^{[1
]}

机构：

[1] UNIV CONSTANCE,FAK CHEM,D-7750 CONSTANCE,FED REP GER

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1986年 / 19卷

关键词：

D O I：

10.1107/S0021889886089264

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：336 / 342

页数：7

共 15 条

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[8] A SYSTEMATIC METHOD OF ESTIMATING THE PERFORMANCE OF X-RAY OPTICAL-SYSTEMS FOR SYNCHROTRON RADIATION .1. DESCRIPTION OF VARIOUS OPTICAL-ELEMENTS IN POSITION-ANGLE SPACE FOR IDEALLY MONOCHROMATIC X-RAYS
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[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1980, 13 (DEC) : 465 - 471
[9] A SYSTEMATIC METHOD OF ESTIMATING THE PERFORMANCE OF X-RAY OPTICAL-SYSTEMS FOR SYNCHROTRON RADIATION .2. TREATMENT IN POSITION-ANGLE-WAVELENGTH SPACE
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KAMINAGA, U
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1980, 13 (DEC) : 472 - 478
[10] AN X-RAY SPECTROMETER FOR INELASTIC-SCATTERING EXPERIMENTS .3. DESIGN AND PERFORMANCE
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SUORTTI, P
WEYRICH, W
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1986, 19 : 353 - 363

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