HIGH-RESOLUTION DIFFUSE-X-RAY SCATTERING STUDY FROM NEARLY PERFECT SILICON SINGLE-CRYSTALS

被引：28

作者：

LAL, K

SINGH, BP

VERMA, AR

机构：

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1979年 / 35卷 / MAR期

关键词：

D O I：

10.1107/S0567739479000607

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

[No abstract available]

引用

收藏

页码：286 / 295

页数：10

相关论文

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[6] JAMES RW, 1948, OPTICAL PRINCIPLES D, P239
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[9] HIGH-RESOLUTION EXPERIMENTAL-TECHNIQUES OF MEASUREMENT OF DIFFUSE X-RAY-SCATTERING FROM SINGLE-CRYSTALS
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