OXIDE STRUCTURE IN EVAPORATED ALUMINUM FILMS

[1] ENHANCEMENT OF SUPERCONDUCTIVITY IN METAL FILMS [J]. PHYSICAL REVIEW LETTERS, 1966, 17 (12) : 632 - &

[2] EINFLUSS DER KONDENSATION BEI TIEFEN TEMPERATUREN AUF DEN ELEKTRISCHEN WIDERSTAND UND DIE SUPRALEITUNG FUR VERSCHIEDENE METALLE [J]. ZEITSCHRIFT FUR PHYSIK, 1954, 138 (02): : 109 - 120

[3] WIEN FILTER FOR USE AS AN ENERGY ANALYZER WITH AN ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (05) : 630 - +

[4] Guinier A., 1963, XRAY DIFFRACTION

[5] ENHANCEMENT OF SUPERCONDUCTIVITY IN ALUMINUM FILMS [J]. PHYSICAL REVIEW B, 1971, 3 (05): : 1611 - &

[6] HIRSCH PB, 1965, ELECTRON MICROSCOPY

[7] HOSEMANN R, 1962, DIRECT ANAL DIFFRACT, pCH11

[8] SUPERCONDUCTIVITY IN SMALL CRYSTALLITES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1968, 29 (10) : 1765 - &

[9] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J]. PHYSICAL REVIEW B, 1970, 1 (04): : 1382 - &

[10] MAYER H, 1959, STRUCTURE PROPERTIES

[1] ENHANCEMENT OF SUPERCONDUCTIVITY IN METAL FILMS [J]. PHYSICAL REVIEW LETTERS, 1966, 17 (12) : 632 - &

[2] EINFLUSS DER KONDENSATION BEI TIEFEN TEMPERATUREN AUF DEN ELEKTRISCHEN WIDERSTAND UND DIE SUPRALEITUNG FUR VERSCHIEDENE METALLE [J]. ZEITSCHRIFT FUR PHYSIK, 1954, 138 (02): : 109 - 120

[3] WIEN FILTER FOR USE AS AN ENERGY ANALYZER WITH AN ELECTRON MICROSCOPE [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (05) : 630 - +

[4] Guinier A., 1963, XRAY DIFFRACTION

[5] ENHANCEMENT OF SUPERCONDUCTIVITY IN ALUMINUM FILMS [J]. PHYSICAL REVIEW B, 1971, 3 (05): : 1611 - &

[6] HIRSCH PB, 1965, ELECTRON MICROSCOPY

[7] HOSEMANN R, 1962, DIRECT ANAL DIFFRACT, pCH11

[8] SUPERCONDUCTIVITY IN SMALL CRYSTALLITES [J]. JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1968, 29 (10) : 1765 - &

[9] ELECTRICAL-RESISTIVITY MODEL FOR POLYCRYSTALLINE FILMS - CASE OF ARBITRARY REFLECTION AT EXTERNAL SURFACES [J]. PHYSICAL REVIEW B, 1970, 1 (04): : 1382 - &

[10] MAYER H, 1959, STRUCTURE PROPERTIES