TRANSMISSION ELECTRON-MICROSCOPE INVESTIGATIONS OF DEFECTS PRODUCED BY INDIVIDUAL DISPLACEMENT CASCADES IN SI AND GE

被引:11
作者
RUAULT, MO [1 ]
JAGER, W [1 ]
机构
[1] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439
来源
JOURNAL OF MICROSCOPY-OXFORD | 1980年 / 118卷 / JAN期
关键词
D O I
10.1111/j.1365-2818.1980.tb00247.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
引用
收藏
页码:67 / 73
页数:7
相关论文
共 12 条
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