AN AMORPHOUS-SILICON IMAGING DETECTOR WITH A PHOSPHOR SHEET FOR NONDESTRUCTIVE TESTING AND RADIOGRAPHY

被引：3

作者：

HASEGAWA, K

MOCHIKI, K

TAKAHASHI, H

INADA, T

HAYAKAWA, Y

IKEDA, C

KATOH, R

机构：

[1] FUJI XEROX,EBINASHI 24304,JAPAN

[2] MUSASHI INST TECHN,TAMAZUTUMI 158,JAPAN

[3] UNIV TUKUBA,INST BASIC MED SCI,TSUKUBA 305,JAPAN

[4] UNIV TOKYO,DEPT NUCL ENGN,BUNKYO KU,TOKYO 113,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1991年 / 310卷 / 1-2期

关键词：

D O I：

10.1016/0168-9002(91)91082-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An amorphous silicon linear sensor originally manufactured for facsimile has been applied to imaging systems for industrial nondestructive testing and radiography. X-ray images can be measured by scanning of a single linear sensor with a Gd2O2S phosphor sheet set on a sliding stage. To reduce the exposure time a semi-area detector with 16 linear sensors has been also constructed. The spatial resolution of 2.5 line pair/mm was obtained for X-ray images with an area of 30 x 25 cm2.

引用

页码：471 / 474

页数：4