DIGITAL RECONSTRUCTION OF BRIGHT FIELD PHASE-CONTRAST IMAGES FROM HIGH-RESOLUTION ELECTRON-MICROGRAPHS

被引：34

作者：

KIRKLAND, EJ ^{[1
]}

SIEGEL, BM ^{[1
]}

UYEDA, N ^{[1
]}

FUJIYOSHI, Y ^{[1
]}

机构：

[1] KYOTO UNIV,INST CHEM RES,UJI,KYOTO 611,JAPAN

来源：

ULTRAMICROSCOPY | 1980年 / 5卷 / 04期

关键词：

Compendex;

D O I：

10.1016/S0304-3991(80)80006-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

IMAGE PROCESSING

引用

收藏

页码：479 / 503

页数：25

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