PRECISE REFLECTION INTERFEROMETRY SYSTEM FOR AN ABSOLUTE STANDARD OF VOLTAGE

被引：6

作者：

CLOTHIER, WK

SLOGGETT, GJ

BAIRNSFATHER, H

机构：

来源：

OPTICAL ENGINEERING | 1980年 / 19卷 / 06期

关键词：

Compendex;

D O I：

10.1117/12.7972620

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

INTERFEROMETRY

引用

页码：834 / 842

页数：9

共 13 条

[1] INFRARED REFLECTANCE AND EMITTANCE OF SILVER AND GOLD EVAPORATED IN ULTRAHIGH VACUUM [J].

BENNETT, JM ;

ASHLEY, EJ .

APPLIED OPTICS, 1965, 4 (02) :221-&

[2] FREQUENCY STABILIZATION OF INTERNAL MIRROR HE-NE LASERS - COMMENTS [J].

BENNETT, SJ ;

WARD, RE ;

WILSON, DC .

APPLIED OPTICS, 1973, 12 (07) :1406-1406

[3] PHASE DISPERSION IN MULTILAYER FILMS [J].

BRUCE, CF ;

CIDDOR, PE .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1960, 50 (03) :295-299

[4] OPTICAL-PROPERTIES OF THIN CHROMIUM FILMS [J].

BRUCE, CF ;

CLOTHIER, WK .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (06) :823-829

[5] ON AUTOMATIC PARALLELISM CONTROL IN A SCANNING FABRY-PEROT INTERFEROMETER [J].

BRUCE, CF .

APPLIED OPTICS, 1966, 5 (09) :1447-&

[6]

Clothier W. K., 1965, METROLOGIA, V1, P35

[7]

Clothier W K, 1965, METROLOGIA, V1, P181

[8]

Cohen E. R., 1973, Journal of Physical and Chemical Reference Data, V2, P663, DOI 10.1063/1.3253130

[9]

HEAVENS OS, 1955, OPTICAL PROPERTIES T, P215

[10] THE STRUCTURE OF EVAPORATED METAL FILMS AND THEIR OPTICAL PROPERTIES [J].

SENNETT, RS ;

SCOTT, GD .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1950, 40 (04) :203-211

← 1 2 →