LASER-INDUCED ELECTRIC BREAKDOWN IN SOLIDS

被引：634

作者：

BLOEMBER.N ^{[1
]}

机构：

[1] HARVARD UNIV,DIV ENGN & APPL PHYS,CAMBRIDGE,MA 02138

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1974年 / QE10卷 / 03期

关键词：

D O I：

10.1109/JQE.1974.1068132

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：375 / 386

页数：12

共 48 条

[1]

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PHYSICAL REVIEW LETTERS, 1970, 24 (22) :1217-&

[5] LASER-INDUCED DAMAGE PROBABILITY AT 1.06 MU-M AND 0.69 MU-M [J].

BASS, M ;

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APPLIED OPTICS, 1973, 12 (04) :690-699

[6]

BASS M, 1972, IEEE J QUANTUM ELECT, VQE 8, P338

[7]

BASS M, 1973, IEEE J QUANT ELECT, VQE 9, P890

[8] GAS BREAKDOWN IN LASER AS LIMITATION OF PULSED HIGH-PRESSURE CO2-LASERS [J].

BERGER, PJ ;

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APPLIED PHYSICS LETTERS, 1972, 21 (04) :167-&

[9] ROLE OF CRACKS, PORES, AND ABSORBING INCLUSIONS ON LASER-INDUCED DAMAGE THRESHOLD AT SURFACES OF TRANSPARENT DIELECTRICS [J].

BLOEMBERGEN, N .

APPLIED OPTICS, 1973, 12 (04) :661-664

[10]

Bloembergen N., 1973, Optics Communications, V8, P285, DOI 10.1016/0030-4018(73)90196-X

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