AN EUV IMAGING SPECTROGRAPH FOR HIGH-RESOLUTION OBSERVATIONS OF THE SOLAR CORONA

被引：73

作者：

NEUPERT, WM ^{[1
]}

EPSTEIN, GL ^{[1
]}

THOMAS, RJ ^{[1
]}

THOMPSON, WT ^{[1
]}

机构：

[1] APPL RES CORP,LANDOVER,MD 20785

来源：

SOLAR PHYSICS | 1992年 / 137卷 / 01期

关键词：

D O I：

10.1007/BF00146577

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

An extreme ultraviolet (EUV) imaging spectrograph for the wavelength range from 235 to 450 angstrom has been developed and used for high resolution observations of the Sun. The instrument incorporates a glancing incidence Wolter Type II Telescope and a near-normal incidence toroidal grating spectrograph to achieve near-stigmatic performance over this spectral range. The design of the spectrograph entrance aperture enables both stigmatic spectra with spectral resolution adequate to observe emission line profiles and spectroheliograms of restricted portions of the Sun to be obtained concurrently. In this paper we describe the design and performance of the instrument and provide an overview of results obtained during a sounding rocket flight on May 5, 1989.

引用

页码：87 / 104

页数：18

共 28 条

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