MEASUREMENT OF THE THICKNESS OF THIN FILMS BY MULTIPLE-BEAM INTERFEROMETRY

被引：13

作者：

HEAVENS, OS

机构：

来源：

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B | 1951年 / 64卷 / 377期

关键词：

D O I：

10.1088/0370-1301/64/5/307

中图分类号：

Q [生物科学];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：419 / 425

页数：7

共 10 条

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[3]

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[4] A SENSITIVE ADJUSTMENT FOR INTERFEROMETER PLATES [J].

HEAVENS, OS .

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SCHULZ, LG .

JOURNAL OF CHEMICAL PHYSICS, 1949, 17 (11) :1153-1162

[6] THE THICKNESS MEASUREMENT OF THIN FILMS BY MULTIPLE BEAM INTERFEROMETRY [J].

SCOTT, GD ;

MCLAUCHLAN, TA ;

SENNETT, RS .

JOURNAL OF APPLIED PHYSICS, 1950, 21 (09) :843-846

[7] THE STRUCTURE OF EVAPORATED METAL FILMS AND THEIR OPTICAL PROPERTIES [J].

SENNETT, RS ;

SCOTT, GD .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1950, 40 (04) :203-211

[8] TOPOGRAPHY OF THE FACE OF A DIAMOND CRYSTAL [J].

TOLANSKY, S ;

WILCOCK, WL .

NATURE, 1946, 157 (3992) :583-583

[9]

Tolansky S., 1948, MULTIPLE BEAM INTERF

[10]

TURNER AF, 1950, J PHYS RADIUM, V11, P449

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