A COMPUTER-CONTROLLED SYSTEM FOR THE MEASUREMENT OF COMPLETE ADMITTANCE SPECTRA OF PIEZOELECTRIC RESONATORS

被引：29

作者：

SCHMID, M ^{[1
]}

BENES, E ^{[1
]}

SEDLACZEK, R ^{[1
]}

机构：

[1] VIENNA TECH UNIV, ZENTRUM EDV, A-1040 VIENNA, AUSTRIA

来源：

MEASUREMENT SCIENCE AND TECHNOLOGY | 1990年 / 1卷 / 09期

关键词：

D O I：

10.1088/0957-0233/1/9/021

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A measurement system for the characterisation of the electrical properties of piezoelectric resonators is presented. Admittance of the resonator is measured at successive frequencies controlled by an algorithm which uses small frequency steps when a resonance is found, and large steps between the resonances. During the measurement, characteristic frequencies are marked for each resonance. Further evaluation of the data is done by a least-squares fit, which yields the parameters of the equivalent circuit for each resonance in closed form.

引用

页码：970 / 975

页数：6

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