ELECTRON MICROSCOPY AND SMALL ANGLE X-RAY SCATTERING

被引：5

作者：

TURKEVICH, J

HUBBELL, HH

HILLIER, J

机构：

来源：

DISCUSSIONS OF THE FARADAY SOCIETY | 1950年 / 08期

关键词：

D O I：

10.1039/df9500800348

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：348 / &

共 14 条

[1] An X-ray study of carbon black [J].

Biscoe, J ;

Warren, BE .

[2]

Guinier A., 1939, ANN PHYS-LEIPZIG, V12, P161, DOI DOI 10.1051/ANPHYS/193911120161

[3]

JELLINEK, 1948, ADV CATALYSIS, P256

[4] MEASUREMENT AND ANALYSIS OF SMALL-ANGLE X-RAY SCATTERING [J].

JELLINEK, MH ;

SOLOMON, E ;

FANKUCHEN, I .

INDUSTRIAL AND ENGINEERING CHEMISTRY-ANALYTICAL EDITION, 1946, 18 (03) :172-175

[5]

RAMPINO, 1943, P NAT ACAD SCI, V29, P247

[6]

ROGINSKI, 1946, COMPT REND URSS, V52, P687

[7]

ROGINSKII SZ, 1949, ZH FIZ KHIM+, V23, P1152

[8]

RUSKA, 1940, KOLLOID Z, V92, P276

[9]

SHEKHTER, 1945, ACTA PHYSICOCHIM, V20, P217

[10]

STEVENSON, 1949, THESIS PRINCETON U