SECONDARY-ELECTRON AND BACKSCATTERING MEASUREMENTS FOR POLYCRYSTALLINE COPPER WITH A SPHERICAL RETARDING-FIELD ANALYZER

被引：81

作者：

KOSHIKAWA, T ^{[1
]}

SHIMIZU, R ^{[1
]}

机构：

[1] OSAKA UNIV, DEPT APPL PHYS, SUITA, OSAKA, JAPAN

来源：

关键词：

D O I：

10.1088/0022-3727/6/11/312

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1369 / 1380

页数：12

共 22 条

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