REFLECTION MEASUREMENT TECHNIQUE OF ELECTROOPTIC COEFFICIENTS IN LITHIUM-NIOBATE CRYSTALS AND POLED POLYMER-FILMS

被引：86

作者：

SHUTO, Y

AMANO, M

机构：

[1] NTT Opto-electronics Laboratories, Nippon Telegraph and Telephone Corporation, Tokai

来源：

JOURNAL OF APPLIED PHYSICS | 1995年 / 77卷 / 09期

关键词：

D O I：

10.1063/1.359429

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A simple reflection technique proposed by Teng and Man [Appl. Phys. Lett. 56, 1734 (1990)] as well as independently by Schildkraut [Appl. Opt. 29, 2839 (1990)] for measuring the electro-optic coefficients of poled polymer films is applied to measure the r33 values of both z-cut lithium niobate crystal and diazo-dye-substituted polymer films. The measured r33 value of the lithium niobate crystal is in excellent agreement with the known value, and the observed r33 values of the poled polymer films agree well with those predicted from the second-harmonic-generation measurements. © 1995 American Institute of Physics.

引用

页码：4632 / 4638

页数：7

共 31 条

[1]

AMANO M, 1994, P SOC PHOTO-OPT INS, V2143, P68, DOI 10.1117/12.173835

[2]

BORN M, 1974, PRINCIPLES OPTICS, pCH1

[3] 2ND-ORDER NONLINEARITY IN POLED-POLYMER SYSTEMS [J].