TEMPERATURE AND STRESS SENSITIVITIES OF MICROWAVE FERRITES

被引:10
作者
DIONNE, GF [1 ]
机构
[1] MIT, LINCOLN LAB, LEXINGTON, MA 02173 USA
关键词
D O I
10.1109/TMAG.1972.1067322
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:439 / 443
页数:5
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