SENSITIVITY CONSIDERATIONS IN MICROWAVE PARAMAGNETIC RESONANCE ABSORPTION TECHNIQUES

[1] BLOCH F, 1946, PHYS REV, V70, P460, DOI 10.1103/PhysRev.70.460

[2] RELAXATION EFFECTS IN NUCLEAR MAGNETIC RESONANCE ABSORPTION [J]. PHYSICAL REVIEW, 1948, 73 (07): : 679 - 712

[3] HAMILTON, 1948, RAD LAB SERIES, V6, P475

[4] HOLBACH K, 1954, HELV PHYS ACTA, V27, P259

[5] NOISE SPECTRUM OF CRYSTAL RECTIFIERS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1947, 35 (03): : 252 - 256

[6] MONTGOMERY, RAD LAB SERIES, V11

[7] NOISE IN SILICON MICROWAVE DIODES [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1954, 101 (73): : 317 - 324

[8] RAPID PASSAGE EFFECTS IN ELECTRON SPIN RESONANCE [J]. PHYSICAL REVIEW, 1955, 100 (04): : 1219 - 1221

[9] POUND RV, MIT RAD LAB SERIES, V16

[10] REED ED, 1951, P NATIONAL ELECTRONI, V7, P162

[1] BLOCH F, 1946, PHYS REV, V70, P460, DOI 10.1103/PhysRev.70.460

[2] RELAXATION EFFECTS IN NUCLEAR MAGNETIC RESONANCE ABSORPTION [J]. PHYSICAL REVIEW, 1948, 73 (07): : 679 - 712

[3] HAMILTON, 1948, RAD LAB SERIES, V6, P475

[4] HOLBACH K, 1954, HELV PHYS ACTA, V27, P259

[5] NOISE SPECTRUM OF CRYSTAL RECTIFIERS [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1947, 35 (03): : 252 - 256

[6] MONTGOMERY, RAD LAB SERIES, V11

[7] NOISE IN SILICON MICROWAVE DIODES [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1954, 101 (73): : 317 - 324

[8] RAPID PASSAGE EFFECTS IN ELECTRON SPIN RESONANCE [J]. PHYSICAL REVIEW, 1955, 100 (04): : 1219 - 1221

[9] POUND RV, MIT RAD LAB SERIES, V16

[10] REED ED, 1951, P NATIONAL ELECTRONI, V7, P162