SERVO CONTROLLED FABRY-PEROT-INTERFEROMETER USING CAPACITANCE MICROMETERS FOR ERROR DETECTION

被引：55

作者：

HICKS, TR ^{[1
]}

REAY, NK ^{[1
]}

SCADDAN, RJ ^{[1
]}

机构：

[1] IMPERIAL COLL,PHYS DEPT,ASTRON GRP,10 PRINCES GARDENS,LONDON SW7 1NA,ENGLAND

来源：

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1974年 / 7卷 / 01期

关键词：

D O I：

10.1088/0022-3735/7/1/008

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：27 / 30

页数：4

共 11 条

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