CRITICAL EXPONENTS AND ELECTRICAL RESISTIVITY NEAR NEEL POINT OF CHROMIUM

被引:14
作者
MEADEN, GT
SZE, NH
机构
[1] Department of Physics, Dalhousie University, Halifax, NS
关键词
D O I
10.1016/0375-9601(69)90790-7
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Resistivity measurements show that dρ{variant}/dT∝ε{lunate}- 1 3 to within experimental error just above the Néel point of chromium. This is compatible with the prediction of Suezaki and Mori if the critical exponents α and γ sum to 4 3. © 1969.
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页码:162 / &
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