A FIELD-EMISSION TECHNIQUE TO MEASURE THE MELTING TEMPERATURE OF INDIVIDUAL NANOMETER-SIZED CLUSTERS

被引：30

作者：

CASTRO, T ^{[1
]}

REIFENBERGER, R ^{[1
]}

CHOI, E ^{[1
]}

ANDRES, RP ^{[1
]}

机构：

[1] PURDUE UNIV, SCH CHEM ENGN, W LAFAYETTE, IN 47907 USA

来源：

SURFACE SCIENCE | 1990年 / 234卷 / 1-2期

关键词：

D O I：

10.1016/0039-6028(90)90663-S

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The utility of the field emission microscope in studying individual nanometer-sized clusters is demonstrated. Preformed Au clusters of controlled size are deposited on a W(110) field emitter. The field emission characteristics of the supported clusters are studied after each of a series of heating cycles in which the temperature of the W tip is raised from room temperature to a predetermined high temperature and then cooled again to room temperature. An abrupt change in the current-voltage characteristics from a supported cluster is found to occur at a definite transition temperature. This phenomenon, which is accompanied by a change in the field emission pattern, is interpreted as a melting transition that results in the cluster spreading on the substrate. © 1990.

引用

页码：43 / 52

页数：10

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