A versatile field-ion microscope for metallographic studies

被引：13

作者：

Davies, D. M. ^{[1
]}

Ralph, B. ^{[1
]}

机构：

[1] Univ Cambridge, Dept Met, Cambridge CB2 1TN, England

来源：

JOURNAL OF MICROSCOPY | 1970年 / 91卷

关键词：

D O I：

10.1111/j.1365-2818.1970.tb02221.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The design of a simple and robust field-ion microscope for making routine metallurgical investigations is presented. Particular attention is given to the choice of ancillary facilities such as the cooling and image-intensifying systems. Examples of the applications of this microscope are given.

引用

页码：185 / 195

页数：11

共 26 条

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