INFLUENCE OF ROUGH INTERFACES ON SPECULAR REFLECTION OF X-RAYS

被引：23

作者：

CROCE, P ^{[1
]}

NEVOT, L ^{[1
]}

机构：

[1] FAC SCI ORSAY,INST OPTIQUE,CNRS LAB,91 ORSAY,FRANCE

来源：

关键词：

D O I：

10.1107/S0021889874008946

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：125 / 130

页数：6

共 8 条

[1] Beckman P., 1963, SCATTERING ELECTROMA
[2] CROCE P, 1972, CR ACAD SCI B PHYS, V274, P803
[3] CROCE P, 1972, CR ACAD SCI B PHYS, V274, P855
[4] THIN FILM SURFACE STUDIES BY X-RAY REFLECTION
CROCE, P
DEVANT, G
SERE, MG
VERHAEGHE, MF
[J]. SURFACE SCIENCE, 1970, 22 (01) : 173 - +
[5] CROCE P, 1972, NOUV REV OPTIQUE APP, V3, P37
[6] PARRATT LG, 1954, PHYS REV, V93, P359
[7] PETZOLD W, 1963, Z ANGEW PHYS, V15, P525
[8] DENSITY-MEASUREMENTS OF THIN GERMANIUM FILMS BY TOTAL REFLECTION OF X-RAYS
RENNER, O
[J]. CZECHOSLOVAK JOURNAL OF PHYSICS SECTION B, 1972, B 22 (10): : 1007 - &