CHEMICAL-STATE MAPPING BY X-RAY-FLUORESCENCE USING ABSORPTION-EDGE SHIFTS

被引：14

作者：

SAKURAI, K

IIDA, A

TAKAHASHI, M

GOHSHI, Y

机构：

[1] UNIV TOKYO, FAC ENGN, DEPT IND CHEM, BUNKYO KU, TOKYO 113, JAPAN

[2] NATL LAB HIGH ENERGY PHYS, PHOTON FACTORY, TSUKUBA, IBARAKI 305, JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1988年 / 27卷 / 09期

关键词：

D O I：

10.1143/JJAP.27.L1768

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：L1768 / L1771

页数：4

共 12 条

[1] AGARWAL BK, 1979, XRAY SPECTROSCOPY
[2] AZAROFF LV, 1974, XRAY SPECTROSCOPY, pCH6
[3] A SCANNING-X-RAY FLUORESCENCE MICROPROBE WITH SYNCHROTRON RADIATION
GOHSHI, Y
AOKI, S
IIDA, A
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YAMAJI, H
SAKURAI, K
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1987, 26 (08): : L1260 - L1262
[4] ELEMENT MAPPING BY A SCANNING-X-RAY SYSTEM
GURKER, N
[J]. X-RAY SPECTROMETRY, 1979, 8 (04) : 149 - 158
[5] GURKER N, 1980, ADV XRAY ANAL, V23, P263
[6] ENERGY DISPERSIVE-X-RAY FLUORESCENCE ANALYSIS WITH SYNCHROTRON RADIATION
IIDA, A
SAKURAI, K
MATSUSHITA, T
GOHSHI, Y
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 228 (2-3) : 556 - 563
[7] IIDA A, 1985, ADV XRAY ANAL, V28, P61
[8] ELEMENTAL AND CHEMICAL-STATE IMAGING USING SYNCHROTRON RADIATION
KINNEY, J
JOHNSON, Q
NICHOLS, MC
BONSE, U
NUSSHARDT, R
[J]. APPLIED OPTICS, 1986, 25 (24) : 4583 - 4585
[9] CHARACTERIZATION OF CO-O THIN-FILMS BY X-RAY-FLUORESCENCE USING CHEMICAL-SHIFTS OF ABSORPTION EDGES
SAKURAI, K
IIDA, A
GOHSHI, Y
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1987, 26 (11): : 1937 - 1938
[10] CHEMICAL-STATE ANALYSIS BY X-RAY-FLUORESCENCE USING SHIFTS OF IRON-K ABSORPTION-EDGE
SAKURAI, K
IIDA, A
GOHSHI, Y
[J]. ANALYTICAL SCIENCES, 1988, 4 (01) : 37 - 42