ABSOLUTE PHOTOLUMINESCENT EFFICIENCY AND PHOTON DAMAGE OF SODIUM-SALICYLATE IN THE SOFT-X-RAY REGIME

被引:9
作者
HUSK, DE
TARRIO, C
BENITEZ, EL
SCHNATTERLY, SE
机构
[1] Jesse W Beams Laboratory of Physics, University of Virginia, Charlottesville, VA
关键词
D O I
10.1364/JOSAB.9.000152
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We have measured the absolute photoluminescent efficiency of sodium salicylate from 70 to 400 eV, as well as the inelastic electron-scattering spectrum from 0 to 200 eV. We find that features in the luminescence spectrum can be described well by using a model incorporating absorptance, reflectance, carrier-diffusion length, and reduced surface-recombination velocity. We have also measured the dose (total photons/unit area) dependence of the model's efficiency at several photon energies. Results indicate a decrease in efficiency when dose and x-ray energy are increased, which makes this material a nonideal choice for long-term stable detection of high-intensity soft x rays. The decrease in efficiency is caused by a bulk-damage process that is second order in the number of electron-hole pairs produced by the incident x rays, as well as by changes in surface-recombination velocity.
引用
收藏
页码:152 / 156
页数:5
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