THIN-FILM CONDUCTING AND SEMICONDUCTING RESISTANCE THERMOMETERS FOR SURFACE-TEMPERATURE MEASUREMENT

被引：3

作者：

HANNEMANN, RJ ^{[1
]}

机构：

[1] BELL TEL LABS INC,WHIPPANY,NJ 07981

来源：

JOURNAL OF ENGINEERING FOR POWER-TRANSACTIONS OF THE ASME | 1977年 / 99卷 / 03期

关键词：

D O I：

10.1115/1.3446508

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：385 / 390

页数：6

共 16 条

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[2] BECK JV, 1960, T ASME C, V82, P27
[3] BERRY R, 1968, THIN FILM TECHNOLOGY, P333
[4] MINIATURE THIN FILM THERMOMETERS WITH RAPID RESPONSE
COOPER, MG
LLOYD, AJP
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (11): : 791 - &
[5] DOEBELIN EO, 1966, MEASUREMENT SYSTEMS, P461
[6] HANNEMANN RJ, 1975, THESIS MASSACHUSETTS
[7] MEYRIAL P, 1970, 4TH P INT HEAT TRANS, V4
[8] MILLS R, 1972, BELL LABORATORIES IN
[9] MILMAN O, 1972, TEPLOENERGETIKA, V19, P93
[10] MOELLER C, 1972, TEMPERATURE ITS MEAS, V4, P1046