THIN-FILM CONDUCTING AND SEMICONDUCTING RESISTANCE THERMOMETERS FOR SURFACE-TEMPERATURE MEASUREMENT

被引:3
作者
HANNEMANN, RJ [1 ]
机构
[1] BELL TEL LABS INC,WHIPPANY,NJ 07981
来源
JOURNAL OF ENGINEERING FOR POWER-TRANSACTIONS OF THE ASME | 1977年 / 99卷 / 03期
关键词
D O I
10.1115/1.3446508
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:385 / 390
页数:6
相关论文
共 16 条
  • [1] BECK JV, 1962, T ASME C, V84, P124
  • [2] BECK JV, 1960, T ASME C, V82, P27
  • [3] BERRY R, 1968, THIN FILM TECHNOLOGY, P333
  • [4] MINIATURE THIN FILM THERMOMETERS WITH RAPID RESPONSE
    COOPER, MG
    LLOYD, AJP
    [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1965, 42 (11): : 791 - &
  • [5] DOEBELIN EO, 1966, MEASUREMENT SYSTEMS, P461
  • [6] HANNEMANN RJ, 1975, THESIS MASSACHUSETTS
  • [7] MEYRIAL P, 1970, 4TH P INT HEAT TRANS, V4
  • [8] MILLS R, 1972, BELL LABORATORIES IN
  • [9] MILMAN O, 1972, TEPLOENERGETIKA, V19, P93
  • [10] MOELLER C, 1972, TEMPERATURE ITS MEAS, V4, P1046