COMPARISON OF CALCULATED AND ACTUAL DENSITY RESPONSES OF A MAGNETORESISTIVE HEAD

被引:18
作者
SCHWARZ, TA
DECKER, SK
机构
[1] IBM Corp., General Products Division, San Jose
关键词
D O I
10.1109/TMAG.1979.1060484
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Using a shielded MR read head, we have successfully recorded and reproduced an allones pattern at data densities up to 5600 flux charges/mm (fc/mm). Both NRZ and AC bias waveforms were used in the write element. No indication of the gap null expected at 4000 fc/mm was seen. An analytic expression for the response of a shielded magnetoresistive head with the element located assymmetrically in the gap to a sinusoidal magnetization pattern has been developed. This expression fits the observed density response quite well. © 1979 IEEE
引用
收藏
页码:1622 / 1624
页数:3
相关论文
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