YIELD OPTIMIZATION OF ANALOG ICS USING 2-STEP ANALYTIC MODELING METHODS

被引：12

作者：

GUARDIANI, C ^{[1
]}

SCANDOLARA, P ^{[1
]}

BENKOSKI, J ^{[1
]}

NICOLLINI, G ^{[1
]}

机构：

[1] SGS THOMSON MICROELECTR,F-38019 GRENOBLE,FRANCE

来源：

IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1993年 / 28卷 / 07期

关键词：

D O I：

10.1109/4.222176

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Innovative methods for statistical design optimization have been applied to the development of analog IC blocks. The most important feature of these methods is the derivation of an analytic function representing the yield surface in the design parameter space. Using this analytic model it is possible to optimize the yield accurately and efficiently. All the required operations are implemented in an integrated and fully automated CAD system. A comparison between simulated and measured data on several wafer lots demonstrates the validity of the approach.

引用

页码：778 / 783

页数：6

共 24 条

[1] APPLICATION OF STATISTICAL DESIGN AND RESPONSE-SURFACE METHODS TO COMPUTER-AIDED VLSI DEVICE DESIGN [J].

ALVAREZ, AR ;

ABDI, BL ;

YOUNG, DL ;

WEED, HD ;

TEPLIK, J ;

HERALD, ER .

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1988, 7 (02) :272-288

[2]

[Anonymous], 2016, LINEAR NONLINEAR PRO

[3] DESIGN CENTERING BY YIELD PREDICTION [J].

ANTREICH, KJ ;

KOBLITZ, RK .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1982, 29 (02) :88-96

[4]

BOX GEP, 1987, APPLIED REGRESSION A

[5]

BOX GEP, 1978, STATISTICS EXPT

[6] A SURVEY OF OPTIMIZATION TECHNIQUES FOR INTEGRATED-CIRCUIT DESIGN [J].

BRAYTON, RK ;

HACHTEL, GD ;

SANGIOVANNIVINCENTELLI, AL .

PROCEEDINGS OF THE IEEE, 1981, 69 (10) :1334-1362

[7]

CECCHETTI M, 1992, SEPP ESSDERC LEUV, P511

[8]

CECCHETTI M, 1992, SGS37104992 THOMS MI

[9]

DIAMOND WJ, 1981, PRACTICAL EXPT DESIG, P41

[10] COMPUTATIONALLY EFFICIENT YIELD ESTIMATION PROCEDURES BASED ON SIMPLICIAL APPROXIMATION [J].

DIRECTOR, SW ;

HACHTEL, GD ;

VIDIGAL, LM .

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS, 1978, 25 (03) :121-130

← 1 2 3 →