SURFACE QUALITY ASSESSMENT USING COMPUTER VISION METHODS

被引：25

作者：

HOY, DEP

YU, F

机构：

[1] Mechanical Engineering Department, Tennessee Technological University, Cookeville, TN 38505

来源：

JOURNAL OF MATERIALS PROCESSING TECHNOLOGY | 1991年 / 28卷 / 1-2期

关键词：

Image Itensity Histograms - Quality Assessment - Surface Quality - Turned Surfaces Quality;

D O I：

10.1016/0924-0136(91)90225-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An assessment of surface quality in turned and milled specimens is made utilizing a PC-based digital imaging system. Two different methods of surface finish measurement are examined and compared. The first approach, as pioneered by Luk and Huynh, utilizes the intensity histogram of the surface image to characterize surface roughness and quality. Changes in the statistical descriptors of the histogram serve to quantify the surface finish. A second method utilizes the two-dimensional Fast Fourier Transform of the digitized surface image. The magnitude and frequency information obtained from the FFT are used as measurement parameters of the surface finish. Advantages and disadvantages of these two methods are discussed and compared.

引用

页码：265 / 274

页数：10

共 5 条

[1]

Young, Vorburger, Teague, In-Process and On-Line Measurement of Surface Finish, Annals of the CIRP, 29, pp. 435-440, (1980)

[2]

Luk, Huynh, A Vision System for In-Process Surface Quality Assessment, Proceedings of the Vision '87 SME Conference, pp. 12-43, (1987)

[3]

Luk, Huynh, A Vision System for In-Process Surface Quality Assessment, Proceedings of the Vision '87 SME Conference, pp. 12-58, (1987)

[4]

Whitehouse, Surfaces - A Link Between Manufacture and Function, ARCHIVE: Proceedings of the Institution of Mechanical Engineers 1847-1982 (vols 1-196), 192, pp. 179-188, (1978)

[5]

Thwaite, Wear, 57, (1979)

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