共 110 条
- [2] AICHISON TW, 1959, J SCI INSTRUM, V36, P400
- [3] ALDRIDGE EE, 1967, IEEE T, VSU14, P89
- [4] A SELF-SCANNED IMAGE SENSOR EMPLOYING MOS STRUCTURE [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (02): : 247 - &
- [6] BARASCH S, 1970, IEEE T, VSU17, P30
- [7] METHOD OF MEASURING DISPLACEMENT USING OPTICAL GRATINGS [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1959, 36 (12): : 501 - 504
- [8] NEW SYSTEM FOR OPTICAL DISPLACEMENT MEASUREMENT [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (11): : 895 - &
- [9] BASSETT GA, 1965, TECHNIQUES ELECTRON
- [10] DESIGN OF DETECTOR ARRAYS FOR LASER ALIGNMENT SYSTEMS [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (01): : 65 - &