MICRODISPLACEMENT TRANSDUCERS

[1] MEASUREMENTS OF DISPLACEMENTS OF SPHERICAL CAPS DURING SNAP-THROUGH BUCKLING [J]. EXPERIMENTAL MECHANICS, 1967, 7 (01) : 23 - &

[2] AICHISON TW, 1959, J SCI INSTRUM, V36, P400

[3] ALDRIDGE EE, 1967, IEEE T, VSU14, P89

[4] A SELF-SCANNED IMAGE SENSOR EMPLOYING MOS STRUCTURE [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (02): : 247 - &

[5] COMPENSATION FOR LINEAR THERMAL EXPANSION [J]. METROLOGIA, 1968, 4 (03) : 145 - &

[6] BARASCH S, 1970, IEEE T, VSU17, P30

[7] METHOD OF MEASURING DISPLACEMENT USING OPTICAL GRATINGS [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1959, 36 (12): : 501 - 504

[8] NEW SYSTEM FOR OPTICAL DISPLACEMENT MEASUREMENT [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (11): : 895 - &

[9] BASSETT GA, 1965, TECHNIQUES ELECTRON

[10] DESIGN OF DETECTOR ARRAYS FOR LASER ALIGNMENT SYSTEMS [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (01): : 65 - &

[1] MEASUREMENTS OF DISPLACEMENTS OF SPHERICAL CAPS DURING SNAP-THROUGH BUCKLING [J]. EXPERIMENTAL MECHANICS, 1967, 7 (01) : 23 - &

[2] AICHISON TW, 1959, J SCI INSTRUM, V36, P400

[3] ALDRIDGE EE, 1967, IEEE T, VSU14, P89

[4] A SELF-SCANNED IMAGE SENSOR EMPLOYING MOS STRUCTURE [J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (02): : 247 - &

[5] COMPENSATION FOR LINEAR THERMAL EXPANSION [J]. METROLOGIA, 1968, 4 (03) : 145 - &

[6] BARASCH S, 1970, IEEE T, VSU17, P30

[7] METHOD OF MEASURING DISPLACEMENT USING OPTICAL GRATINGS [J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1959, 36 (12): : 501 - 504

[8] NEW SYSTEM FOR OPTICAL DISPLACEMENT MEASUREMENT [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (11): : 895 - &

[9] BASSETT GA, 1965, TECHNIQUES ELECTRON

[10] DESIGN OF DETECTOR ARRAYS FOR LASER ALIGNMENT SYSTEMS [J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1970, 3 (01): : 65 - &