STRUCTURAL CHARACTERIZATION OF EPITAXIAL YBCO THIN-FILMS ON SRTIO3 AND LAALO3

被引：1

作者：

GARCIAGONZALEZ, E

WAGNER, G

REEDYK, M

HABERMEIER, HU

机构：

[1] MPI-FKF, 70506 Stuttgart

来源：

PHYSICA C | 1994年 / 235卷

关键词：

D O I：

10.1016/0921-4534(94)91539-3

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The microstructural differences of YBCO thin films prepared by RF sputtering at the optimal deposition conditions for c-axis epitaxy on (100)-SrTiO3 and (100)-LaA1O(3) have been investigated.

引用

页码：631 / 632

页数：2

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