QUANTITATIVE CALCULATION OF SIC POLYTYPES FROM MEASUREMENTS OF X-RAY-DIFFRACTION PEAK INTENSITIES

被引：93

作者：

RUSKA, J ^{[1
]}

GAUCKLER, LJ ^{[1
]}

LORENZ, J ^{[1
]}

REXER, HU ^{[1
]}

机构：

[1] MAX PLANCK INST MET FORSCH,INST WERKSTOFFWISSENSCH,D-7000 STUTTGART 80,FED REP GER

来源：

JOURNAL OF MATERIALS SCIENCE | 1979年 / 14卷 / 08期

关键词：

D O I：

10.1007/BF00551044

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

An experimental determination on powder mixtures of SiC-3C and 6H polytypes using an X-ray goniometer system showed the possibility of quantitative determination of polytype fraction directly from peak intensities. In combination with calculated X-ray intensities of 15R and 4H polytype, the method yields a simple equation system for the relative quantities of SiC polytypes 15R, 6H, 4H and 3C in polycrystalline samples and powder mixtures. © 1979 Chapman and Hall Ltd.

引用

页码：2013 / 2017

页数：5

共 8 条

[1]

BARTRAM SF, 1975, 75CRD022 GEN EL CO R

[2] REVISED X-RAY DIFFRACTION LINE INTENSITIES FOR SILICON CARBIDE POLYTYPES [J].

HANNAM, AL ;

SHAFFER, PTB .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :45-&

[3]

MACGILLARRY CH, 1962, INT TABLES XRAY CRYS, V3, P202

[4]

RUSKA J, 1977, SCI CERAM, V9, P332

[5]

SCHAFFER PTB, 1969, ACTA CRYSTALLOGR B, V25, P477

[6]

Thibault NW, 1944, AM MINERAL, V29, P327

[7]

Thibault NW, 1944, AM MINERAL, V29, P249

[8]

Wyckoff R. W. G., 1963, CRYST STRUCT, V1, P113

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