ORIGIN OF ATOMIC RESOLUTION ON METAL-SURFACES IN SCANNING TUNNELING MICROSCOPY

被引:166
作者
CHEN, CJ
机构
[1] IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights, NY 10598
关键词
D O I
10.1103/PhysRevLett.65.448
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Scanning tunneling microscopy has repeatedly resolved individual atoms on a number of metal surfaces with atomic distances 2.53. This is in sharp contradiction to the resolution limits previously predicted, 69. We present a theory of such atomic resolution in terms of actual tip states, for example, dz2 tip states on tungsten tips. Quantitative interpretation of the observed images is obtained with no adjustable parameters. We predict that to achieve atomic resolution, the tip material should be either a d-band metal or certain semiconductor. © 1990 The American Physical Society.
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页码:448 / 451
页数:4
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