COMPUTATION OF ELECTRON-DIFFRACTION PATTERNS IN LORENTZ ELECTRON-MICROSCOPY OF THIN MAGNETIC-FILMS

被引：44

作者：

MANSURIPUR, M

机构：

[1] Optical Sciences Center, University of Arizona, Tucson

来源：

JOURNAL OF APPLIED PHYSICS | 1991年 / 69卷 / 04期

关键词：

D O I：

10.1063/1.348682

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The vector potential field for a thin magnetic film with arbitrary pattern of magnetization is calculated using fast Fourier transforms. The vector potential is used to compute the phase modulation imparted to the electron beam in Lorentz electron microscopy. Calculated phase patterns and the corresponding intensity distributions for several magnetic configurations of practical interest are described.

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页码：2455 / 2464

页数：10

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