A NEW ULTRAHIGH-VACUUM SCANNING TUNNELING MICROSCOPE DESIGN FOR SURFACE SCIENCE STUDIES

被引:12
作者
POIRIER, GE
WHITE, JM
机构
关键词
D O I
10.1063/1.1140587
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:3113 / 3118
页数:6
相关论文
共 19 条
[1]   NOISE-REDUCTION TECHNIQUE FOR SCANNING TUNNELING MICROSCOPY [J].
ABRAHAM, DW ;
WILLIAMS, CC ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1988, 53 (16) :1503-1505
[2]   THE REACTION OF SI(100) 2X1 WITH NO AND NH3 - THE ROLE OF SURFACE DANGLING BONDS [J].
AVOURIS, P ;
BOZSO, F ;
HAMERS, RJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (05) :1387-1392
[3]   TUNNELING THROUGH A CONTROLLABLE VACUUM GAP [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
APPLIED PHYSICS LETTERS, 1982, 40 (02) :178-180
[4]  
BINNIG G, 1982, HELV PHYS ACTA, V55, P726
[5]   SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
SMITH, DPE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) :1688-1689
[6]   A SIMPLIFIED SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J].
DEMUTH, JE ;
HAMERS, RJ ;
TROMP, RM ;
WELLAND, ME .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :1320-1323
[7]  
FUELNER P, 1980, J VAC SCI TECHNOL, V17, P662
[8]   TRANSITION FROM THE TUNNELING REGIME TO POINT CONTACT STUDIED USING SCANNING TUNNELING MICROSCOPY [J].
GIMZEWSKI, JK ;
MOLLER, R .
PHYSICAL REVIEW B, 1987, 36 (02) :1284-1287
[9]   OBSERVATION OF ATOMIC CORRUGATION ON AU(111) BY SCANNING TUNNELING MICROSCOPY [J].
HALLMARK, VM ;
CHIANG, S ;
RABOLT, JF ;
SWALEN, JD ;
WILSON, RJ .
PHYSICAL REVIEW LETTERS, 1987, 59 (25) :2879-2882
[10]   IMAGING OF CHEMICAL-BOND FORMATION WITH THE SCANNING TUNNELING MICROSCOPE - NH3 DISSOCIATION ON SI(001) [J].
HAMERS, RJ ;
AVOURIS, P ;
BOZSO, F .
PHYSICAL REVIEW LETTERS, 1987, 59 (18) :2071-2074