TEMPERATURE-DEPENDENCE OF FRACTAL FORMATION IN ION-IMPLANTED ALPHA-GE/AU BILAYER THIN-FILMS

被引：46

作者：

HOU, JG

WU, ZQ

机构：

来源：

PHYSICAL REVIEW B | 1989年 / 40卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.40.1008

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1008 / 1012

页数：5

共 17 条

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