REFLEXION ELECTRON MICROSCOPY USING DIFFRACTED ELECTRONS

被引：18

作者：

HALLIDAY, JS

NEWMAN, RC

机构：

来源：

BRITISH JOURNAL OF APPLIED PHYSICS | 1960年 / 11卷 / 04期

关键词：

D O I：

10.1088/0508-3443/11/4/304

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：158 / 162

页数：5

共 13 条

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[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (JAN): : 27 - 31
[3] FERT C, 1954, CR HEBD ACAD SCI, V238, P333
[4] THE ADAPTATION OF AN ELECTRON MICROSCOPE FOR REFLEXION AND SOME OBSERVATIONS ON IMAGE FORMATION
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HIRST, W
[J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (AUG): : 239 - 244
[5] AN ELECTROSTATIC-MAGNETIC ALINEMENT SECTION FOR THE ELECTRON MICROSCOPE
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AGAR, AW
MULVEY, T
[J]. JOURNAL OF SCIENTIFIC INSTRUMENTS, 1958, 35 (10): : 357 - 359
[6] A 3-STAGE ELECTRON MICROSCOPE WITH STEREOGRAPHIC DARK FIELD, AND ELECTRON DIFFRACTION CAPABILITIES
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PAGE, RS
GARFITT, RG
[J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (02) : 173 - 182
[7] HAINE ME, 1956, 1ST P REG C EL MICR, P32
[8] HEIDE HG, 1958, 4TH P INT C EL MICR
[9] HOLMES PJ, 1959, P I ELECT ENG B S15, V106, P287
[10] THE STUDY OF MULTIPLE REFLECTIONS WITH THE AID OF A MICROFOCUS X-RAY SOURCE
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[J]. ACTA CRYSTALLOGRAPHICA, 1957, 10 (04): : 252 - 254