DETERMINATION OF THE INTERFACIAL STRUCTURE OF YBA2CU3O7/SRRUO3 THIN-FILM HETEROSTRUCTURES

被引：7

作者：

JIA, CL ^{[1
]}

DOMEL, R ^{[1
]}

URBAN, K ^{[1
]}

机构：

[1] FORSCHUNGSZENTRUM JULICH GMBH,INST SCHICHT & IONENTECH,D-52425 JULICH,GERMANY

来源：

PHILOSOPHICAL MAGAZINE LETTERS | 1994年 / 69卷 / 05期

关键词：

D O I：

10.1080/09500839408241601

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The interfaces in c-axis-oriented YBa2Cu3O7/SrRuO3/YBa2Cu3O7 triple-layer films are investigated by means of high-resolution transmission electron microscopy. The atomic structure of the interface between the first YBa2Cu3O7 layer and the SrRuO3 layer is clarified by matching a series of experimental [010] images with corresponding calculated images. For the (001) interface a (001) BaO plane of YBa2Cu3O7 layer faces a RuO2 plane of the SrRuO3 layer. Images along [100] of interface steps provide supporting evidence for this and allow. the atomic details across the steps to be determined, where a (010) Cu-O plane connects to an SrO plane. This allows the surface plane of the YBa2Cu3O7 films to be determined. It consists of (001) BaO and (100) and (010) Cu-O planes.

引用

页码：253 / 259

页数：7

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