RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS

被引：192

作者：

TAYLOR, NJ

机构：

[1] Varian Associates, Palo Alto, CA 94033

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1969年 / 40卷 / 06期

关键词：

D O I：

10.1063/1.1684071

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Some of the important considerations in the design of a retarding field analyzer suitable for Auger electron spectroscopy based on display LEED optics are described. From such considerations an instrument has been built with an instrumental linewidth of less than 0.3% (resolution greater than 360). Analysis is made of the limitations insensitivity of the device due to shot noise, and on this basis a comparison is made with a 127° cylindrical electrostatic analyzer. The analysis can be readily extended to other forms of retarding field and deflection analyzers. © 1969 The American Institute of Physics.

引用

页码：792 / &

共 21 条

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