CHARACTERIZATION OF SPUTTERED FILMS OF TL2BA2CACU2O8 USING RAMAN-SCATTERING AND X-RAY-DIFFRACTION

被引：11

作者：

CHRZANOWSKI, J ^{[1
]}

IRWIN, JC ^{[1
]}

HEINRICH, B ^{[1
]}

CURZON, AE ^{[1
]}

FORTIER, N ^{[1
]}

CRAGG, A ^{[1
]}

机构：

[1] CTF SYST INC,PORT COQUITLAM V3C 1M9,BC,CANADA

来源：

PHYSICA C | 1991年 / 182卷 / 4-6期

基金：

加拿大自然科学与工程研究理事会;

关键词：

D O I：

10.1016/0921-4534(91)90517-3

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Thin superconducting films of Tl2Ba2CaCu2O8 deposited on MgO (001) single crystal substrates using a single RF magnetron sputtering source, were investigated using Raman spectroscopy and X-ray diffractometry. A correlation between the apical oxygen vibration and critical temperature T(c) in the Tl-2212 superconducting films was observed for the films grown at fixed calcination conditions and various oxygenation times. Another correlation between small shifts in spectral positions of the lowest-frequency Raman active modes (108 and 132 cm-1) and T(c) has been found and is discussed in terms of partial cation substitution. The Raman spectra can also be used to obtain an estimate of the degree to which the film is crystallized during the annealing process.

引用

页码：231 / 240

页数：10

共 36 条

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