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STRUCTURAL CHARACTERIZATION OF MGO(100) SURFACES

被引：152
作者：
DURIEZ, C
CHAPON, C
HENRY, CR
RICKARD, JM
机构：
[1] Centre de Recherche des Mécanismes, la Croissance Cristalline Laboratoire Propre, CNRS associé aux Universités d'Aix-Marseille 2 et 3., 13288 Marseille Cedex 9, Campus Luminy
来源：
SURFACE SCIENCE | 1990年 / 230卷 / 1-3期
关键词：
D O I：
10.1016/0039-6028(90)90021-Y
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The structure, the microtopography and the cleanliness of MgO(100) surfaces have been investigated by a combination of thermal helium scattering, surface decoration and Auger spectroscopy. The microstructure and cleanliness are strongly dependent on the preparation of the surface. MgO surfaces obtained by cleavage under UHV are clean and present a high coefficient for coherent He reflection. MgO surfaces prepared by cleavage in air are contaminated and irreversibly damaged by water vapour. Such surfaces can be cleaned by vacuum annealing but the coefficient of coherent He reflection remains low because of the presence of a high number of defects. © 1990.
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页码：123 / 136
页数：14
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