CHARACTERIZATION OF A RESISTIVE HALF-PLANE OVER A RESISTIVE SHEET

被引：3

作者：

NATZKE, JR

VOLAKIS, JL

机构：

[1] Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI

来源：

IEEE TRANSACTIONS ON ANTENNAS AND PROPAGATION | 1993年 / 41卷 / 08期

关键词：

D O I：

10.1109/8.244647

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The diffraction of a resistive half plane over a planar resistive sheet under plane wave illumination is determined via the dual integral equation method (a variation of the Wiener-Hopf method). The solution is obtained upon splitting the associated Wiener-Hopf functions via a numerically efficient routine. Based on the derived exact half plane diffraction coefficient, a simplified equivalent model of the structure is developed when the separation of the half plane and resistive plane is on the order of a tenth of a wavelength or less. The model preserves the geometrical optics field of the original structure for all angles and is based on an approximate image theory of the resistive plane. Good agreement is obtained with the diffracted field exact solution.

引用

页码：1063 / 1068

页数：6

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