RELATIONSHIP BETWEEN MAGNETORESISTANCE AND LATTICE UNCERTAINTY AT THE INTERFACE IN SPUTTERED FE/CR MULTILAYER FILMS

被引：36

作者：

TAKANASHI, K

OBI, Y

MITANI, Y

FUJIMORI, H

机构：

[1] Institute for Materials Research, Tohoku University, Sendai 980, Katahira, Aoba-ku

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1992年 / 61卷 / 04期

关键词：

FE/CR MULTILAYER; RF-SPUTTERING; MAGNETORESISTANCE; X-RAY LINE BROADENING; INTERFACE ROUGHNESS; PARACRYSTALLINE DISORDER;

D O I：

10.1143/JPSJ.61.1169

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We have investigated the relationship between the magnetoresistance and the paracrystalline disorder of lattice plane spacings at the interface in Fe/Cr multilayer films prepared by rf sputtering. The X-ray linewidths for the (110) and (220) peaks were analysed using a modified paracrystalline theory to obtain the grain size and the lattice uncertainty, which represents the degree of paracrystalline disorder. We have found that the magnetoresistance increases with decreasing lattice uncertainty.

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页码：1169 / 1172

页数：4

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