CORRECTIONS TO TABULATED ANOMALOUS-SCATTERING FACTORS

被引：149

作者：

KISSEL, L ^{[1
]}

PRATT, RH ^{[1
]}

机构：

[1] UNIV PITTSBURGH,DEPT PHYS & ASTRON,PITTSBURGH,PA 15260

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1990年 / 46卷

关键词：

D O I：

10.1107/S0108767389010718

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

[No abstract available]

引用

页码：170 / 175

页数：6

共 47 条

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[4]

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[5]

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[7] X-RAY INTERFEROMETER MEASUREMENTS OF THE ANOMALOUS DISPERSION CORRECTION F'(OMEGA,0) FOR SOME LOW-Z ELEMENTS [J].

CREAGH, D .

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[8] USE OF X-RAY INTERFEROMETRY TO MEASURE X-RAY REFRACTIVE-INDEXES [J].

CREAGH, DC .

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[9] ANOMALOUS DISPERSION CALCULATIONS NEAR TO AND ON THE LONG-WAVELENGTH SIDE OF AN ABSORPTION-EDGE [J].

CROMER, DT ;

LIBERMAN, DA .

ACTA CRYSTALLOGRAPHICA SECTION A, 1981, 37 (MAR) :267-268

[10] CALCULATION OF ANOMALOUS SCATTERING FACTORS AT ARBITRARY WAVELENGTHS [J].

CROMER, DT .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (AUG) :437-437

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