OBSERVATION OF X-RAY DIFFUSE SCATTERING FROM NEUTRON-IRRADIATED SILICON

被引：4

作者：

COY, RA

THOMAS, JE

BALDWIN, TO

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1971年 / 42卷 / 03期

关键词：

D O I：

10.1063/1.1660177

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1236 / &

共 11 条

[1] USE OF ANOMALOUS X-RAY TRANSMISSION FOR DETECTION OF DEFECTS PRODUCED IN SILICON AND GERMANIUM BY FAST NEUTRON IRRADIATION [J].

BALDWIN, TO ;

THOMAS, JE .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) :4391-&

[2] INVESTIGATION OF FAST-NEUTRON RADIATION DAMAGE IN NEARLY PERFECT COPPER CRYSTALS BY X-RAY DIFFRACTION TECHNIQUES [J].

BALDWIN, TO ;

SHERRILL, FA ;

YOUNG, FW .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1541-&

[3] EFFECTS OF FAST NEUTRON IRRADIATION AND OF IMPURITIES ON X-RAY INTENSITIES DIFFRACTED BY GERMANIUM AND SILICON CRYSTALS [J].

COLELLA, R ;

MERLINI, A .

PHYSICA STATUS SOLIDI, 1966, 14 (01) :81-&

[4]

GUINIER A, 1955, SMALL ANGLE SCATTERI, P95

[5]

KOU WH, 1969, THESIS KANSAS STATE

[6]

Ouden G, 1968, J APPL PHYS, V39, P4509

[7] INVESTIGATION OF NEUTRON-IRRADIATION DAMAGE IN SILICON BY TRANSMISSION ELECTRON MICROSCOPY [J].

PANKRATZ, JM ;

SPRAGUE, JA ;

RUDEE, ML .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (01) :101-&

[8] DIRECT OBSERVATION OF NEUTRON DAMAGE IN GERMANIUM [J].

PARSONS, JR ;

BALLUFFI, RW ;

KOEHLER, JS .

APPLIED PHYSICS LETTERS, 1962, 1 (03) :57-58

[9]

PERRET RG, 1967, SMALL ANGLE XRAY SCA, P373

[10]

THOMAS JO, TO BE PUBLISHED

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