A METHOD OF DISTINGUISHING BETWEEN GAUSS AND CAUCHY DIFFRACTION PROFILES

被引：7

作者：

MITRA, GB

机构：

来源：

ACTA CRYSTALLOGRAPHICA | 1963年 / 16卷 / 05期

关键词：

D O I：

10.1107/S0365110X63001110

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：429 / &

共 5 条

[1] INFLUENCE OF THE APPARATUS FUNCTION ON CRYSTALLITE SIZE DETERMINATIONS WITH GEIGER COUNTER SPECTROMETERS
SCHOENING, FRL
VANNIEKERK, JN
HAUL, RAW
[J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1952, 65 (391): : 528 - 535
[2] THE EFFECT OF COLD-WORK DISTORTION ON X-RAY PATTERNS
WARREN, BE
AVERBACH, BL
[J]. JOURNAL OF APPLIED PHYSICS, 1950, 21 (06) : 595 - 599
[3] X-RAY STUDIES OF DEFORMED METALS
WARREN, BE
[J]. PROGRESS IN METAL PHYSICS, 1959, 8 : 147 - 202
[4] THE USE OF FOURIER ANALYSIS IN THE INTERPRETATION OF X-RAY LINE BROADENING FROM COLD-WORKED IRON AND MOLYBDENUM
WILLIAMSON, GK
SMALLMAN, RE
[J]. ACTA CRYSTALLOGRAPHICA, 1954, 7 (8-9): : 574 - 581
[5] A NOTE ON THE LINE PROFILES ASSOCIATED WITH MISTAKES
WILSON, AJC
[J]. ACTA CRYSTALLOGRAPHICA, 1958, 11 (03): : 227 - 228