THE INFLUENCE OF THE X-RAY WAVELENGTH ON THE BEHAVIOR OF POLAR KOSSEL REFLECTIONS

被引：3

作者：

GEIST, V ^{[1
]}

NOLZE, G ^{[1
]}

机构：

[1] ANALYT ZENTRUM BERLIN,ABT XPD,O-1199 BERLIN,GERMANY

来源：

CRYSTAL RESEARCH AND TECHNOLOGY | 1992年 / 27卷 / 01期

关键词：

D O I：

10.1002/crat.2170270119

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

The Kossel effect permits a determination of polar directions in non-centrosymmetrical structures. To identify polar reflections unambiguously, differences - as large as possible - in their fine structures are necessary. These differences considerably depend on both the diffraction geometry and the characteristic X-ray wavelength applied. The reasons of such behaviour are deliberated upon hereinafter and a good harmony achieved of theoretical predictions and experimental findings.

引用

页码：101 / 109

页数：9

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