EFFECT OF STRUCTURAL RELAXATION ON THE ELECTRICAL-RESISTIVITY OF PD82-XVXSI18 AMORPHOUS ALLOYS

被引:30
作者
LIN, CH
BEVK, J
TURNBULL, D
机构
[1] Harvard University, Cambridge
关键词
D O I
10.1016/0038-1098(79)91192-X
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The dependence of the resistivity-temperature and resistivity-structural relaxation behavior of amorphous Pd82-xVxSi18 alloys on Vanadium content, 0≦x≦6, was investigated. The temperature coefficient of resistivity at constant volume decreases with x, going from positive to negative at x≈4, while the resistivity change due to structural relaxation (πrelaxed - πunrelaxed) increases with x, going from negative to positive at x≈2. This behavior is shown to be consistent with the Ziman theory. © 1979.
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页码:641 / 644
页数:4
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