MIRROR ELECTRON-MICROSCOPY APPLIED TO THE CONTINUOUS LOCAL MEASUREMENT OF WORK-FUNCTION VARIATIONS

被引：24

作者：

BABOUT, M

GUIVARCH, M

PANTEL, R

BUJOR, M

GUITTARD, C

机构：

[1] INST NATL SCI APPL LYON, INFORMAT APPL LAB, F-69621 VILLEURBANNE, FRANCE

[2] CNRS, CTR RECH PHYS ENVIRONNEMENT, F-45045 ORLEANS, FRANCE

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1980年 / 13卷 / 07期

关键词：

D O I：

10.1088/0022-3727/13/7/011

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1161 / +

页数：1

共 12 条

[1] MIRROR ELECTRON-MICROSCOPY APPLIED TO DETERMINATION OF TOTAL ELECTRON REFLECTION COEFFICIENT AT A METALLIC SURFACE [J].

BABOUT, M ;

LEBOSSE, JC ;

LOPEZ, J ;

GAUTHIER, R ;

GUITTARD, C .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (17) :2331-2341

[2]

BABOUT M, 1977, 7TH P INT VAC C ICCS, P663

[3] ADSORPTION OF OXYGEN ON W(100) - ADSORPTION-KINETICS AND STRUCTURE [J].

BAUER, E ;

POPPA, H ;

VISWANATH, Y .

SURFACE SCIENCE, 1976, 58 (02) :517-549

[4] EXPERIMENTAL-STUDY OF INFLUENCE OF SURFACE-POTENTIAL VARIATIONS ON MEASUREMENT OF ELECTRON-TEMPERATURE OF A PLASMA BY AN ELECTROSTATIC-PROBE [J].

BUJOR, M .

JOURNAL OF APPLIED PHYSICS, 1977, 48 (10) :4202-4209

[5]

BUJOR M, 1976, THESIS U ORLEANS

[6] AUTOMATIC-MEASUREMENT OF WORK FUNCTION VARIATION ON MICRO-SURFACES [J].

DUPUY, JC ;

LAYDEVANT, L ;

ETIENNE, S .

JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1976, 9 (03) :176-178

[7] ADSORPTION STUDIES BASED ON THERMIONIC EMISSION MEASUREMENTS .2. OXYGEN ON SINGLE-CRYSTAL TUNGSTEN [J].

ENGELMAI.W ;

STICKNEY, RE .

SURFACE SCIENCE, 1968, 11 (03) :370-&

[8]

GUITTARD C, 1968, 4TH P EUR REG C EL M, P107

[9]

LEBIHAN R, 1977, 7TH P INT VAC C ICCS, P2647

[10]

OMAN RM, 1969, ADV ELECTRON ELECTRO, V26, P217

← 1 2 →