QUANTITATIVE MICROANALYSIS BY HEAVY-ION BEM INDUCED X-RAY-EXCITATION

被引：3

作者：

MITCHELL, IV ^{[1
]}

LENNARD, WN ^{[1
]}

SANDERS, JB ^{[1
]}

机构：

[1] FOM,INST,AMSTERDAM,NETHERLANDS

来源：

NUCLEAR INSTRUMENTS & METHODS | 1980年 / 168卷 / 1-3期

关键词：

D O I：

10.1016/0029-554X(80)91241-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：121 / 123

页数：3

共 15 条

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[9]

LENNARD WN, UNPUBLISHED

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